Unmatched Precision in Contamination Control

Key Features of Our Products

Discover the advanced features that make our contamination wafer standards and polystyrene latex beads the preferred choice for semiconductor manufacturing and cleanroom environments.

High-Precision Engineering

Consistent Quality

Versatile Applications

Applications in Semiconductor Manufacturing

Our contamination wafer standards are essential for ensuring the accuracy and reliability of semiconductor manufacturing processes. They help in detecting and controlling particulate contamination, thereby enhancing the performance and yield of semiconductor devices.

Applications in Cleanroom Environments

Polystyrene latex beads are widely used in cleanroom environments for calibration and validation purposes. They provide a reliable standard for particle size and distribution, ensuring that cleanroom conditions meet stringent industry standards.

Benefits of Our Products

By incorporating our contamination wafer standards and polystyrene latex beads into your processes, you benefit from improved contamination control, enhanced product quality, and increased operational efficiency. Trust Applied Metrology USA for precision solutions that drive success in advanced contamination control and metrology.

Benefits of Using Our Products

Contamination wafer standards and polystyrene latex beads are essential for ensuring the highest levels of reliability and accuracy in contamination control. These products help maintain the integrity of semiconductor manufacturing processes by providing consistent and reproducible results.

By utilizing our contamination wafer standards, you can achieve precise calibration and validation of your contamination measurement systems, leading to improved process control and reduced downtime.

Polystyrene latex beads offer uniform particle size distribution, which is crucial for accurate particle counting and sizing in cleanroom environments. This ensures that your contamination control measures are both effective and efficient.

Product Specifications

Contamination Wafer Standards

Material: Silicon

Diameter: 150 mm, 200 mm, 300 mm

Particle Size Range: 0.1 µm to 10 µm

Surface Cleanliness: Ultra-clean

Application: Semiconductor manufacturing, cleanroom validation

Polystyrene Latex Beads

Material: Polystyrene

Diameter: 0.05 µm to 10 µm

Concentration: 1% solids

Uniformity: High monodispersity

Application: Particle size calibration, contamination control

Additional Specifications

Storage Conditions: Store in a cool, dry place

Shelf Life: 2 years from date of manufacture

Packaging: Cleanroom-compatible containers

Certification: ISO 9001:2015

Custom Solutions: Available upon request

Performance Metrics

Accuracy: ±0.01 µm

Repeatability: 99.9%

Traceability: NIST-traceable standards

Compatibility: Compatible with major metrology equipment

Reliability: High stability under various environmental conditions

Usage Guidelines

Handling: Use in a controlled environment

Calibration: Follow manufacturer’s instructions

Maintenance: Regularly inspect for contamination

Disposal: Dispose of according to local regulations

Support: Technical support available 24/7

Ordering Information

Lead Time: 2-4 weeks

Minimum Order Quantity: 10 units

Bulk Discounts: Available for large orders

Shipping: Worldwide shipping available

Compliance

Regulations: Compliant with international standards

Safety: Non-toxic and safe for use

Environmental Impact: Eco-friendly manufacturing processes

Documentation: Comprehensive user manuals provided

Certifications: CE, RoHS, ISO certified

Customer Support

Warranty: 1-year limited warranty

Technical Assistance: Available via phone and email

Training: On-site and online training sessions

Resources: Access to extensive online resources

Feedback: Customer feedback is highly valued

What Our Customers Say

“Applied Metrology USA’s contamination wafer standards have significantly improved our process control. The accuracy and reliability are unmatched.”
John Doe, Semiconductor Manufacturer
“The polystyrene latex beads from Applied Metrology USA have been a game-changer for our cleanroom validation. Their uniformity and precision are exactly what we needed.”
Jane Smith, Cleanroom Manager
“We have been using Applied Metrology USA’s products for over a year now, and their customer support and product quality have always exceeded our expectations.”
Michael Brown, Research Scientist

Discover Our Cutting-Edge Solutions

Unlock the full potential of your contamination control and metrology processes with our industry-leading products. Click below to explore our range or get in touch with our experts for personalized assistance.