Discover Our Expertise

Applied Metrology USA: Precision in Contamination Control

Explore how our advanced solutions in metrology and contamination control can elevate your processes to new heights of accuracy and reliability.

About Applied Metrology USA

Founded with a vision to revolutionize contamination control and metrology, Applied Metrology USA has been at the forefront of innovation and quality for over a decade. Our mission is to provide precision-engineered products that meet the stringent demands of semiconductor manufacturing, cleanroom environments, and scientific research. We are committed to delivering tailored solutions that ensure reliability and accuracy, helping our clients achieve their goals with confidence.
Our values are rooted in excellence, integrity, and customer satisfaction. We believe in continuous improvement and innovation, striving to exceed industry standards and expectations. Our team of experts is dedicated to advancing the field of metrology and contamination control, leveraging their extensive knowledge and experience to develop cutting-edge solutions that address the unique challenges faced by our clients.

Meet Our Expert Team

Our team at Applied Metrology USA is composed of highly skilled professionals with extensive experience in contamination control and metrology. Each member brings a wealth of knowledge and a commitment to excellence, ensuring that we provide the best solutions for our clients.

Dr. Emily Johnson

Dr. Emily Johnson

Chief Metrology Officer

Michael Smith

Michael Smith

Senior Contamination Control Specialist

Sarah Lee

Sarah Lee

Lead Product Engineer

David Brown

David Brown

Quality Assurance Manager

Our Services

At Applied Metrology USA, we provide a comprehensive suite of services designed to meet the highest standards in contamination control and metrology. Our expertise ensures precision and reliability in every solution we offer.

01

Contamination Wafer Standards

02

Polystyrene Latex Beads

03

Cleanroom Certification

04

Metrology Consulting

What Our Clients Say

Applied Metrology USA’s contamination control solutions have significantly improved our manufacturing processes. Their expertise and dedication to quality are unmatched.

John Doe

Production Manager, TechCorp

The precision and reliability of the products from Applied Metrology USA have been a game-changer for our research lab. We highly recommend their services.

Jane Smith

Lead Scientist, CleanTech Labs

Get in Touch

Ready to elevate your contamination control processes? Contact Applied Metrology USA today to learn more about our tailored solutions and request a quote.